
Transmission Electron Microscopy (TEM)
Talos F200X Scanning/Transmission Electron Microscope (S/TEM)
By FEI - Talos F200X
Princeton University
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Room temperature S/TEM imaging and analysis including differential phase contrast (DPC), bright field, dark field and high-angle annular dark field imaging, electron diffraction, highly sensitive 4-detector Super-X EDS for quantitative elemental analysis and mapping.
Min. Booking: 1 hours
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