FEI Themis Z Advanced Probe Aberration Corrected Analytical TEM/STEM

A comparative table of the TEM systems available in the MRL is given here. The FEI Themis Z is and advanced analytical scanning/transmission electron microscope (STEM/TEM) from Thermo Fisher Scientific Company that operates between the electron energy of 60 to 300 keV with a Schottky electron emitter, an electron energy monochromator, and a 5th order probe spherical aberration corrector. The microscope is additionally equipped for chemical analysis using highly efficient and fast electron energy loss spectroscopy (EELS) and energy dispersive X-ray spectroscopy (EDS) systems. This instrument will meet the research needs of electron imaging and chemical analysis in materials research. Specifically, the microscope enables imaging and chemical mapping in 2D and 3D at atomic or nanoscales by providing following research capabilities: 1) performing low voltage spectral analysis for molecules and single atoms using EELS, 2) conducting ultra-sensitive mapping of local bonding and oxidation states using EELS, and 3) analysis of composition and crystallographic orientation in 2D and 3D using EDS. In addition to the acoustic enclosure that comes with the instrument, a custom-designed metal room was built around the whole microscope to ensure proper cancellation of electromagnetic fields that would negatively affect the performance of the instrument. The structure, called MuROOM, from Magnetic Shield Co., uses metal layers including a nickel-iron alloy sheet to shield fields that would affect, for instance, the high energy resolution required for the analytical capabilities of the instrument. The MuRoom was featured in this article. EMPAD (Electron Microscope Pixelated Array Detector), a pixelated detector for applications as 4D STEM acquiring diffraction pattern in each point of a map at a speed of up to 1,100 diffraction patterns per second. The EMPAD sensor is a 128x128 direct electron detector with pixels of 150 microns in size. It is sensitive to a single electron and