Electron Microscope, Scanning - Tescan Lyra3 GMU FIB SEM

A state of the art SEM with Schottky field emission (FE) cathode in combination with gallium Focused Ion Beam (FIB) column and Gas Injection System (GIS). The SEM/FIB used is managed by the University of New Hampshire's (UNH's) University Instrumentation Center (UIC) and was purchased with funds awarded to UNH from the US National Science Foundation (NSF) (MRI Grant 1337897; Todd Gross, Mechanical Engineering, UNH, PI) with additional funds from UNH. EDS/EBSD components on this system were purchased with start-up funds from UNH at the discretion of Marko Knezevic (Mechanical Engineering, UNH). The Knowledge Base contains forms, instruction and training material, minutes, policies, tools and other resources to support your research efforts by topic area. W123 Parsons HallDurham, NH 03824Phone: (603) 862-2182 UNH Rate: $94.00/hour  assisted$37.00/hour  unassisted Non UNH academic Rate: $168.00/hour  assisted$70.00/hour   unassisted Industry Rate:$300.00/hour assisted$180.00/hour unassisted