Hitachi SU8230 UHR Cold Field Emission (CFE) SEM

Hitachi’s next generation Cold Field Emission SEM offers unmatched low‑voltage imaging and comprehensive analytical microanalysis with the uncompromised performance of CFE. Features: High image resolution: 0.8 nm. Air protection vessel: enabling the workflow from glovebox to SEM directly. EDS (horizontal insert): ~10-100 times high signal sensitivity than tilted model; Featured with 10 – 100 nm mapping resolution with higher sensitivity to light element detection. Deceleration mode (0.1-1 kV): enhanced surface details and high resolution on 2D materials. STEM: scanning TEM capability. External BSE (photodiode backscattered electron) horizontal insert detector.