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PHI 710 Scanning Auger NanoProbe

By Physical Electronics, Inc. - PHI 710 Scanning Auger NanoProbe (2025)

The University of Toronto - OCCAM
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Qtac Low Energy Ion Scattering Spectrometer (ION-TOF GmbH.) Scanning Auger Nanoprobe PHI 710 Scanning Auger NanoProbe (Physical Electronics, Inc.) High lateral resolution and high depth resolution quantitative elemental and chemical state information Key Functionalities •Quantitative elemental and chemical state characterization •Variable spot-size and multiple-area spectroscopy •High resolution electron imaging •High spatial resolution surface-specific elemental and chemical state mapping •High resolution depth profiling Key Configuration Parameters •Cylindrical mirror analyzer •Co-axially mounted Schottky field emission electron source (1-25 keV) •Motorized precision 5-axis specimen stage •5 kV floating column Ar ion source (for surface cleaning, depth profiling, charge neutralization) •60 mm specimen load-lock and introduction •Controlled atmosphere sample transfer

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