Atomic Force Microscope (AFM)
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By Bruker
The University of Utah
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AFM provides surface topology by using a probe to detect the intermolecular forces between the sample surface and the probe. Tian, K., Tudu, B., Tiwari, A., Growth and Characterization of Zinc Oxide Thin Films on Flexible Substrates at Low Temperature Using Pulsed Laser Deposition, Vacuum, 2017, 146, 483 - 491.
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