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FEI Helios 600i Dual Beam SEM/FIB
By FEI
University of Illinois Urbana-Champaign
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The Helios NanoLab 600i is an advanced SEM/FIB DualBeam™ workstation for ultra-high resolution imaging and focussed Ga+ ion beam milling for nano-prototyping, nano-machining, nano-analysis, and sample preparation for TEM and atom probe.
Min. Booking: 1 hours
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