scanning electron_microscopy
FEI Magellan 400 XHR-SEM
By FEI (Thermo Fisher) - Magellan 400 XHR (2025)
University of Massachusetts Amherst
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The FEI Magellan 400 XHR-SEM is a thermal field emitter base high resolution microscope featuring an Oxford X-MAX 80mm2 Energy Dispersive X-ray Spectrometer for element mapping. Capabilities include Low-Voltage Scanning Transmission Electron Microscopy with HAADF and Electron Backscattering Diffraction (EBSD).
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