JEOL JEM 2800

The JEM 2800 is capable of providing sub nanometer resolution images. It has both secondary and transmission electron imaging modes that allow for visualization of the bulk as well as the surface of the material under analysis. Fast elemental mapping and composition analysis is made possible by the unique dual SDD design. When publishing or presenting results collected from the JEOL 2800, please use the following acknowledgement: “This work made use of University of Utah Nanofab shared facilities supported, in part, by the MRSEC Program of the NSF under Award No. DMR-112125” PtNi Nanocluster             Carbon Nanotubes           Bright & Dark Field Images of Au Nanoparticles Si(111) wafer                                         Cr crystallite on MgH2 EDS map and TEM image of SiO2 coated Fe Nanocubes         MgH2 nanocatalyst