Image of Bruker Dimension ICON3 Atomic Force Microscope
Scanning Probe Microscopy (SPM)

Bruker Dimension ICON3 Atomic Force Microscope

By Bruker - Dimension ICON3

Princeton University
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The Icon3® atomic force microscope (AFM) introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry; high performance, multifunctional, scanning probe microscope (SPM) optimized for peak force characterization.

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