Transmission Electron Microscope

Training requirements: 6 hours basic wide-field TEM imaging; requires demonstrated proficiency on the Philips CM-12 TEM; additional 2 hours for BF/DF STEM; additional 2 hours for EDS spectral analysis and elemental mapping; additional 2 hours for diffraction techniques. A multipurpose 80 kV – 200 kV TEM/STEM equipped with a LaB6 thermionic electron emitter. High resolution objective lens polepiece: 0.14 nm lattice resolution; 0.23 nm point-to-point resolution. High sensitivity 4 MP JEOL Flash CMOS camera for wide-field imaging. Dedicated bright-field and dark-field STEM detectors: 1.0 nm STEM-BF image resolution (edge-to-edge). Microprocessor controlled electron optical system and console with TEM Center software control for all functions. Equipped with a JEOL JED-2300 Dry SDD EDS Detector: 100 mm active area; for qualitative and quantitative x-ray analysis and elemental map acquisition. Electron diffraction modes: convergent beam (CBED) and nano-beam (NBD). Single-tilt and double-tilt holders are available.