JEOL JEM-2200FS Energy Filtered Transmission Electron Microscope

The JEOL JEM-2200FS EFTEM features an in-column Electron Energy Loss Filter for EELS and EFTEM and an Oxford X-MAX 80mm2 Energy Dispersive X-ray Spectrometer. The instrument is setup for analytical applications such as Electron Tomography while still maintaining high-resolution in High Angle Annular Dark Field Imaging. Features Schottky Thermal Field Emitter Source.