Zeiss Xradia 410 Versa System

A Zeiss Xradia 410 Versa system was acquired and set up through a separate NSF MRI award, led by Professor Elise Morgan (ME, BME, MSE) (efmorgan@bu.edu). This tool bridges the gap between high-performing X-ray microscopy (XRM) and less powerful computed tomography (CT) systems. This system provides quantitative 3-D characterization of materials microstructure at multiple length scales down to the sub-micron, including porosity, density, surface area, and topological measures such as 3-D connectivity.