Focused Ion Beams (FIB)

Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) is an advanced imaging and analysis technique used extensively in materials science and biological research. It combines the capabilities of a FIB and a SEM to provide high-resolution 3D imaging and precise material characterization. The FIB allows for site-specific material removal/deposition for cross sectioning, preparing TEM or atom probe samples, nano-prototyping, and circuit editing. The SEM component offers high-resolution imaging of the sample's surface, creating a powerful tool for analyzing microstructures and nanostructures with exceptional precision.