Focused Ion Beam System (FIB)
Helios NanoLab G3 UC DualBeam (FIB/SEM)
By FEI - Helios NanoLab G3 UC
Princeton University
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The FIB/SEM dual-beam system provides the unique capability to add or subtract material at precisely defined locations with high spatial resolution. Its integrated nano-manipulator allows preparation of TEM lamellas. 3D reconstructions is enabled through a "slice and view" before computationally recombining into a single 3D volume. Additional features include:
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