Xenocs Xeuss 3.0 SAXS/WAXS

This instrument supports the development of cutting-edge nanostructured materials that have keys features ranging in size from Angstroms to hundreds of nanometers. To enable in situ and in operando characterization of structural properties, this custom, automated Xenocs Xeuss 3.0 x-ray scattering system will enable high-throughput studies at a variety of length scales.