
Scanning Probe Microscopy (SPM)
Bruker NanoMan AFM
By Bruker - NanoMan
Princeton University
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The NanoMan AFM incorporates the Dimension platform, the advanced NanoScope V controller and the Hybrid XYZ scanner to create the preeminent system for high-resolution imaging, high-definition nanolithography, and direct nanoscale manipulation. The NanoMan is also able to perform highly accurate force curves, nanoindenting and pulling techniques. This state-of-the-art AFM operates in closed-loop mode, enabling a single instrument solution for nanolithography, nanomanipulation, and imaging for material and life science applications.
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